Signal Integrity CENTRE OF EXCELLENCE / 01

Signal Integrity Analysis
for High-Speed PCB Designs

Pre/post-layout · channel analysis · eye diagram · PDN compliance

Pre and post-layout signal integrity analysis covering impedance profiling, crosstalk evaluation, eye diagram compliance, and power delivery network characterisation — from schematic to final PCB at multi-GHz data rates.

Pre-Layout SIPost-Layout SIEye DiagramCrosstalkPDN AnalysisHigh-Speed PCB

What We Deliver

Complete Channel Performance Assessment
from Schematic to Final Board

Signal integrity failures are among the most costly and difficult to debug post-production. Our signal integrity team identifies impedance discontinuities, reflections, and crosstalk paths during the design phase — before PCB fabrication — enabling targeted corrections that prevent bit errors, margin failures, and EMI issues at multi-GHz data rates.

We support both pre-layout analysis and post-layout verification across SerDes, DDR, USB, PCIe, and custom high-speed interfaces — from early topology decisions through to design sign-off.

6 Analysis Areas
Multi-GHz Data Rate Coverage
Pre & Post Layout Support

Key Problems We Solve

Bit errors at high data rates
Signal reflections and eye closure
Crosstalk in dense PCB routing
PDN noise coupling to signal nets

6 Analysis Areas

Signal Integrity Capabilities

Select a capability to explore the methodology, deliverables, and tools in detail.

01

ANALYSIS TYPE / 01

Pre-Layout Analysis

stack-up · routing rules · topology planning

Establishing impedance targets, layer stack constraints, differential pair spacing rules, and via design guidelines before routing begins — preventing costly design rework after tape-out by setting correct SI parameters from day one.

Deliverables
Layer Stack ReportSI Design Rules DocumentVia Model LibraryImpedance Target Table
Tools Used
Ansys SIwaveAnsys HFSSSaturn PCB ToolkitPolar Si9000

Key Aspects

ASPECT / 01

Layer Stack Definition

Defining dielectric materials, copper weights, and layer sequence to achieve target differential and single-ended impedances across the full operating frequency range.

ASPECT / 02

Impedance Targeting

Computing controlled impedance values for all critical net classes — LVDS, DDR, SerDes, USB — and establishing tolerance budgets for PCB fabrication.

ASPECT / 03

Routing Rule Generation

Translating SI simulation results into DRC-enforceable routing rules: trace width, spacing, length matching, and reference plane requirements.

ASPECT / 04

Via & Connector Models

Building accurate via and connector models using field-solver data, establishing via stubs, back-drill requirements, and connector launch optimisation.

02

ANALYSIS TYPE / 02

Impedance Discontinuity

reflection · insertion loss · mismatch analysis

Identifying vias, connectors, bends, reference plane gaps, and stubs that create impedance mismatches — quantifying reflection and insertion loss penalties at operating frequency and providing targeted redesign guidance.

Deliverables
Discontinuity Analysis ReportS-Parameter ModelsBack-Drill SpecificationRedesign Recommendations
Tools Used
Ansys HFSSAnsys SIwaveAnsys Raptor XVector Network Analyser Correlation

Key Aspects

ASPECT / 01

Via Stub Analysis

Computing resonant frequency penalties from unterminated via stubs and defining back-drill depth requirements to remove insertion loss at target data rates.

ASPECT / 02

Connector Launch Optimisation

Simulating connector launch geometries to match source impedance, minimising reflections at board-to-connector interfaces in high-speed assemblies.

ASPECT / 03

Reference Plane Gap Analysis

Identifying split planes, anti-pads, and routing across gaps that cause impedance excursions and return current disruption on critical signal nets.

ASPECT / 04

S-Parameter Extraction

Extracting broadband S-parameter models of discontinuities for system-level channel simulation and correlation with physical measurement data.

03

ANALYSIS TYPE / 03

Crosstalk & Coupling

NEXT · FEXT · spacing · shielding

Computing near-end (NEXT) and far-end (FEXT) crosstalk between adjacent signal traces and differential pairs — defining required spacing, return current management, and guard trace strategy for reliable high-density routing.

Deliverables
Crosstalk Analysis ReportAggressor-Victim MapSpacing Rule UpdatesLayout Recommendations
Tools Used
Ansys SIwaveAnsys HFSSAnsys Raptor XIBIS Models

Key Aspects

ASPECT / 01

NEXT & FEXT Analysis

Simulating forward and backward crosstalk induced on victim nets as a function of aggressor amplitude, routing length, and layer separation.

ASPECT / 02

Aggressor-Victim Mapping

Identifying the most critical aggressor-victim net pairs in dense routing areas and ranking coupling severity to prioritise layout changes.

ASPECT / 03

Spacing Rule Derivation

Determining minimum trace separation to maintain crosstalk below budget values for each interface class — balancing SI performance with routing density.

ASPECT / 04

Guard Trace Effectiveness

Quantifying noise reduction achieved by guard traces and stitching vias, and identifying cases where guard traces offer marginal benefit versus routing space cost.

04

ANALYSIS TYPE / 04

Eye Diagram & Jitter

BER · margin · jitter decomposition

Simulating complete channel performance at the target bit rate — generating statistical eye diagrams, BER estimates, and full jitter decomposition to evaluate mask compliance and identify margin-limiting contributors.

Deliverables
Eye Diagram ReportJitter DecompositionBER vs. Margin CurvesEqualiser Recommendations
Tools Used
Ansys SIwaveIBIS-AMI ModelsAnsys PathFinderKeysight ADS

Key Aspects

ASPECT / 01

Statistical Eye Diagram

Constructing statistical eye diagrams via IBIS-AMI or channel simulation for realistic bit-rate performance assessment, including ISI, random jitter, and deterministic jitter contributions.

ASPECT / 02

Jitter Budget Analysis

Decomposing total jitter into deterministic, random, and bounded uncorrelated components — attributing margin loss to specific physical root causes in the channel.

ASPECT / 03

BER Estimation

Projecting bit error rate at target operating margin to confirm compliance with interface specifications such as PCIe, USB 3.x, and DDR eye mask requirements.

ASPECT / 04

Equalization Optimization

Evaluating CTLE, FFE, and DFE equaliser settings to maximise eye opening and determine the optimal TX/RX equalization strategy for the channel under analysis.

05

ANALYSIS TYPE / 05

SerDes & DDR Compliance

PCIe · USB · DDR4/5 · equalisation

Validating PCIe, USB 3.x, HDMI, DDR4/5, and custom SerDes channels against specification-defined eye masks and jitter budgets — including full equalisation optimisation and compliance margin reporting.

Deliverables
Compliance Test ReportDDR Timing AnalysisMargin Budget DocumentSpecification Eye Masks
Tools Used
Ansys SIwaveAnsys HFSSIBIS-AMIPathFinderKeysight ADS

Key Aspects

ASPECT / 01

Interface Specification Compliance

Mapping simulation results to PCIe, USB, HDMI, SATA, and custom SerDes compliance test points and mask definitions for pre-silicon channel sign-off.

ASPECT / 02

DDR4/DDR5 Timing Analysis

Performing full DDR4 and DDR5 timing analysis including tDQSQ, tQH, read/write levelling, and fly-by topology validation across voltage and temperature corners.

ASPECT / 03

Channel Margin Analysis

Quantifying design margin above specification limits and identifying which channel segments consume the most margin budget for targeted improvement.

ASPECT / 04

Multi-Protocol Validation

Validating boards carrying multiple high-speed protocols — ensuring each interface achieves compliance simultaneously without inter-protocol interference.

06

ANALYSIS TYPE / 06

Post-Layout Verification

extracted parasitics · Gerber verification · design sign-off

Extracting full-board S-parameter models from final Gerber data and verifying that the routed design meets all SI targets before prototype builds — providing design sign-off confidence backed by field-solver-accurate simulation.

Deliverables
Post-Layout SI ReportSign-off DocumentationS-Parameter DeckCorrelation Data
Tools Used
Ansys SIwaveAnsys HFSSAnsys Raptor XVNA Measurement Data

Key Aspects

ASPECT / 01

Parasitic Extraction

Performing full parasitic extraction from final layout data — including coupled inductance, capacitance, and resistance — for accurate post-route SI simulation.

ASPECT / 02

Gerber-to-Model Flow

Converting fabrication-ready Gerber and ODB++ data into 3D EM models, closing the gap between design intent and manufactured geometry.

ASPECT / 03

Pre-Prototype Sign-off

Generating a formal SI sign-off report before prototype build authorisation — documenting all interfaces, margins, and outstanding risks.

ASPECT / 04

Measurement Correlation

Correlating post-layout simulation results with physical measurement data from lab characterisation to validate model accuracy and refine simulation methodology.

Discuss Your Signal Integrity Challenge

Talk to our Centre of Excellence team about pre-layout rule definition, post-layout verification, or eye diagram compliance for your high-speed design.

Contact Us Today