ANALYSIS TYPE / 04
ESD · BCI · radiated immunity · IEC 61000
Overview
Evaluating electronic system immunity to conducted and radiated disturbances — simulating ESD events, bulk current injection, and radiated field exposure to predict susceptibility before IEC 61000, ISO 11452, and DO-160 chamber testing.
Deliverables
Key Aspects
Modelling IEC 61000-4-2 ESD contact and air discharge events, tracing current paths through the PCB to IC pins and evaluating the adequacy of TVS protection and layout shielding.
Simulating ISO 11452-4 BCI test setups to predict induced voltage and current levels at IC inputs from cable injection — validating filter and ferrite protection effectiveness.
Computing induced voltages on PCB traces and cable harnesses from external radiated fields per IEC 61000-4-3 and ISO 11452-2, identifying sensitive circuit nodes at risk of upset.
Documenting susceptibility margin above required test levels for each disturbance type, identifying circuits with marginal immunity and recommending targeted hardening measures.
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