A brand of the CADFEM Group

Powering Electronics and Semiconductor Innovation

Simulation-driven insights for signal integrity, reliability, and high-performance system integration

Accelerate Innovation Across the Electronics & Semiconductor Value Chain

The electronics and semiconductor industries are at the heart of digital transformation—powering everything from smart devices and data centers to electric vehicles and aerospace systems. With increasing product complexity, tighter power and thermal constraints, and the push for miniaturization, engineers face mounting challenges in design, validation, and reliability.

CADFEM, with Ansys solutions, empowers companies to digitally design and validate their products across the chip–package–board–system hierarchy. Whether you’re optimizing signal integrity in high-speed PCBs, simulating thermal reliability in 3D ICs, or validating EMI/EMC performance, our multiphysics simulation workflows help you innovate faster, reduce failures, and comply with global standards.

Power Integrity and Signal Integrity

Advanced EMI/EMC & Shielding Simulation

Thermal and Mechanical Reliability

Advanced Packaging and 3D IC Multiphysics

Antenna Simulation and Wireless System Integration

Low-Frequency Electromagnetic Applications

Data Center Simulation

Industry Challenges

Rising Design Complexity Across Chip–Package–Board Levels

As integration scales, managing electrical, thermal, and physical interactions across multiple design layers becomes increasingly difficult.

Electromagnetic Interference and Signal Degradation at High Frequencies

High-speed designs face EMI issues and signal integrity challenges that compromise performance and compliance.

Thermal Runaway, Solder Fatigue, and Early-Life Failures

Electronics are increasingly vulnerable to thermal stress and mechanical fatigue, impacting reliability and longevity.

Pressure to Shorten Tape-Out and Validation Timelines

Market demands push for faster design-to-silicon cycles, leaving less room for physical validation and iteration.

Growing Compliance Needs: JEDEC, IPC, CISPR, ISO, etc.

Designs must now adhere to multiple overlapping international standards, increasing the complexity of verification.

Demand for Compact, Low-Power, and Reliable Designs

Space-constrained applications like consumer electronics and EVs require power-efficient, highly reliable systems.

Product-Driven Simulation Solutions

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Frequently Asked Questions

Simulation accelerates EV development by enabling virtual testing of components like battery systems, electric motor design, and power electronics, helping reduce development time and improve performance across the electrified powertrain.
Yes, CADFEM enables ADAS development through high-fidelity simulation for sensor integration, vehicle exterior aerodynamics, and control logic testing, ensuring safer and more reliable autonomous vehicle functions.
Absolutely. CADFEM’s multiphysics simulation helps optimize thermal management, combustion, and power electronics, leading to better energy efficiency and reduced emissions in hybrid and electric vehicles (HEVs).
Simulation is essential for autonomous vehicles, offering virtual environments to validate sensor performance, test scenarios, and optimize ADAS features—accelerating safe and scalable development.
Simulation minimizes the need for costly prototypes by validating concepts early, using vehicle chassis simulation, battery simulation, and digital twin technology for accurate performance predictions.
Yes, CADFEM offers advanced tools for thermal management to ensure efficient cooling in EVs and HEVs, covering battery systems, inverters, and electric motors, enhancing safety and longevity.
CADFEM leverages vehicle interior simulation, crash and safety analysis, and multiphysics simulation to assess and improve NVH, structural integrity, and passenger safety across all vehicle platforms.

Ensuring Clean Power and Reliable High-Speed Signals

As digital systems scale toward multi-GHz signaling, multi-gigabit SerDes, DDR5/DDR6, and PCIe Gen5/6, both power integrity (PI) and signal integrity (SI) become critical bottlenecks. Noise on the power delivery network (PDN) directly couples into high-speed signals, while discontinuities in signal paths create jitter, eye closure, and data corruption.

CADFEM, with Ansys solutions, provides end-to-end PI/SI workflows spanning chip-package-board-system, enabling early detection of bottlenecks, optimized decoupling, and compliance-ready channel validation.

Focus Points

Challenges

Simultaneous Switching Noise and Voltage Droops

Rapid current transients in SoCs create PDN instability, reducing timing margins.

Multi-GHz Jitter and Eye Closure

As signaling speeds push beyond 32–112 Gbps, small discontinuities cause severe timing violations.

Return-Path & Ground Bounce Issues

Incomplete return paths at vias/connectors lead to EMI leakage, SI degradation, and PDN resonance.

Optimal Decap Strategy in Complex PDNs

Balancing capacitor size, placement, and mounting inductance becomes increasingly complex in dense layouts.

Interconnect Parasitics in Advanced Packaging

TSVs, micro-bumps, and interposers introduce coupling paths not seen in traditional PCBs.

System-Level PI-SI Interaction

Noise coupling between PDN and signal channels must be validated together, not in isolation.

Compliance Across Multiple Standards

Channels must simultaneously meet compliance for multiple protocols (e.g., DDR + PCIe on same board).

Advanced PI/SI Workflows

Applications

Semiconductors

Chip-level PI/EMIR with system-level package/PCB correlation.

PCIe Gen6, 112G SerDes, DDR5/DDR6 memory interfaces.

High-Speed Computing

LPDDR5/6, USB4, HDMI, high-density SoC packaging.

Mobile & Consumer

High-speed links in ADAS, infotainment, and ECU platforms.

Automotive & EV

Robust PDN and SI design for mission-critical electronics.

Aerospace & Defense

Virtual Validation for Reverberation Chambers, Shielding Effectiveness, Radiated/Conducted Emissions, and Harsh Electromagnetic Environments

Electronics today operate in environments saturated with electromagnetic fields—from 5G base stations and IoT hubs to aircraft, defense platforms, and mission-critical data centers. Ensuring compliance, shielding, and resilience against EMI/EMC threats is a major design and certification challenge. Physical EMC testing (reverberation chambers, anechoic chambers, RE/CE measurements, shielding tests) is expensive and iterative.
CADFEM, powered by Ansys solutions, enables virtual compliance—covering Radiated Emissions (RE), Conducted Emissions (CE), ESD, immunity, shielding effectiveness, and reverberation chambers—accelerating product readiness while reducing costly lab cycles.

Focus Points

Challenges

Regulatory Compliance

Meeting CISPR 11/22/32, FCC Part 15, MIL-STD-461, DO-160, ISO 11452, and IEC 61000 EMC standards.

Cost of Physical Testing

EMC chambers, RE/CE test benches, and shielding tests are expensive with multiple re-spins common.

Complex Cable & Harness Networks

Long cables act as antennas, amplifying conducted/radiated emissions and susceptibility.

Shielding vs. Ventilation Trade-offs

Balancing airflow for cooling with EMI shielding in dense electronic enclosures.

Harsh EM Environments

Defense, aerospace, and critical infrastructure must withstand HIRF, EMP, and lightning.

Applications

Aerospace & Defense

HIRF, lightning strike, RE/CE compliance, shielding of avionics and radomes.

Automotive

EMC compliance of EV electronics, busbars, inverters, and harnesses (RE, CE, immunity).

Data Centers & Telecom

Rack-level shielding, reverberation chamber-based compliance, RE control.

Industrial & Energy

Shielding of power cabinets, substations, renewable inverters under CE/RE stress.

Medical Devices

EMC validation of implants, diagnostic instruments, and life-critical equipment.

Ensuring Thermal and Mechanical Robustness

From hot-spots to solder fatigue and drop events, CADFEM’s multiphysics reliability workflows simulate thermal, structural, and shock/vibration stresses to predict product life before hardware build.

Focus Points

Challenges

Localized Hotspots in High-Density Packages

Power-dense chips develop thermal hotspots that reduce performance and lifetime.

Solder Fatigue Under Thermal Cycling

Cyclic thermal loads cause solder joint degradation, especially in automotive and aerospace applications.

Warpage of Interposers and Substrates

Layered packages are susceptible to warping due to material mismatches and thermal stress.

Board Bending During Shock and Vibration

Mechanical deformations during transport or usage can lead to cracks and electrical failure.

Integrating Electrical, Thermal, and Mechanical Loads

Multiphysics interactions must be analyzed together to ensure real-world robustness.

Enabling Next-Gen 2.5D/3D IC Integration

The semiconductor industry is rapidly transitioning to heterogeneous integration and advanced packaging to keep pace with Moore’s Law alternatives. Chiplets, interposers, and 3D stacked dies offer higher bandwidth, lower latency, and improved power efficiency — but they also introduce complex multiphysics challenges spanning electrical, thermal, and mechanical domains.
CADFEM, with Ansys multiphysics platforms, provides foundry-certified sign-off workflows for advanced packaging and 3D ICs, ensuring reliability from chiplet-to-system.

Focus Points

Challenges

Inter-Die Coupling in Dense 3D Stacks

Electromagnetic and thermal coupling between closely stacked dies increases leakage and crosstalk risks.

Thermal Management of Stacked Die

Limited cooling pathways lead to hotspots, reliability degradation, and accelerated aging.

Electromagnetic Crosstalk in Tight Interconnects

Dense TSV and RDL networks increase SI/PI challenges at 112G SerDes, DDR5/6, and HBM speeds.

Mechanical Stress in Vertical Packaging

CTE (Coefficient of Thermal Expansion) mismatches induce stress and delamination in 2.5D/3D stacks.

Cross-Domain Verification Across EDA & MCAD

Packaging success depends on seamless integration of electrical, thermal, and structural solvers.

Yield and Manufacturability

Complex heterogeneous integration poses yield, alignment, and assembly challenges.

Advanced Workflows

Applications

High-Performance Computing (HPC)

HBM-enabled GPUs, CPUs, and AI accelerators with stacked 3D memory.

Mobile & Consumer SoCs

Chiplet-based AP/Modem/Memory integration for smartphones and AR/VR devices.

Automotive Electronics

Reliable 2.5D/3D ICs for ADAS, infotainment, and EV control units.

Networking & Telecom

112G SerDes, optical/electrical co-packaging, and chiplet-based CXL/PCIe architectures.

Defense & Aerospace

Radiation-hardened 2.5D/3D ICs with strict thermal and reliability requirements.

Designing, Validating, and Optimizing Antennas for Modern Applications

With the growing adoption of 5G, Wi-Fi 7, IoT, satellite communications, and automotive radar, antenna design has become central to electronics innovation. Antennas must not only deliver high performance in isolation but also coexist with complex PCB layouts, enclosures, human bodies, and surrounding systems. CADFEM, powered by Ansys solvers, enables engineers to virtually prototype, optimize, and integrate antennas in real-world environments—shortening design cycles and ensuring compliance.

Focus Points

Challenges

5G and mmWave Antennas in Compact Devices

Designing high-frequency antennas within limited space while meeting gain and efficiency targets.

Array Calibration and Mutual Coupling

Phased-array and MIMO systems require accurate modeling of element interactions to maintain beam patterns.

Antenna Placement Near Human Body or Vehicle Structure

Wearable and automotive antennas face detuning, absorption, and compliance risks.

Electromagnetic Interference with Co-Located Radios

Smartphones, EVs, and IoT hubs integrate multiple radios, creating coexistence and EMI challenges.

Validation Across Realistic Operating Environments

Antennas must be tested virtually in enclosures, buildings, vehicles, or outdoor ranges to ensure reliable performance.

Applications

Telecom & 5G

Massive MIMO base-stations, mmWave smartphone antennas

Automotive & Aerospace

Radar, GNSS, V2X, SATCOM, in-flight Wi-Fi

Consumer Electronics

Wearables, AR/VR devices, IoT hubs, smartphones

Defense & Space

High-gain phased arrays, satellite payload antennas, radomes

Designing Reliable Motors, Actuators, Solenoids, and Power Systems

Electromechanical components form the backbone of energy conversion and motion systems across automotive, industrial, medical, and aerospace domains. From high-efficiency motors and actuators to robust busbars and inductive charging systems, engineers must balance electromagnetic performance, thermal reliability, and mechanical integrity. CADFEM, with Ansys solutions, provides a unified multiphysics environment to design, optimize, and validate these low-frequency electromagnetic devices.

Focus Points

Challenges

Efficiency and Loss Minimization

Reducing copper and iron losses while maximizing torque density and system efficiency.

Thermal Runaway in High-Current Devices

Excessive joule heating in busbars, coils, and windings reduces lifespan and reliability.

Magnetic Saturation and Nonlinear Materials

Accurate modeling of nonlinear BH-curves is critical for transformers and actuators.

Short-Circuit and Fault Tolerance

Ensuring structural and thermal robustness of busbars and switchgear during transient overloads.

Coupling With Control Systems

Validating motor performance under real drive cycles and controller algorithms.

Noise, Vibration, and Harshness (NVH)

Electromagnetic forces induce vibrations in motors and actuators, requiring coupled EM–structural simulations.

Applications

Automotive & EV

Traction motors, inverters, busbars, battery contactors, EV charging coils

Industrial Automation

Actuators, robotics motors, solenoids for precision machinery

Energy & Power

Transformers, reactors, and high-current busbars in substations

Aerospace & Defense

Electromagnetic actuators, solenoids, cryogenic motors, and magnetic bearings

Optimizing Power, Cooling, and Reliability for Next-Generation Data Centers

Data centers are the backbone of the digital economy, supporting AI, cloud, IoT, and high-performance computing. With rising power densities, accelerated deployment timelines, and stringent energy-efficiency goals, operators face significant challenges in ensuring performance, uptime, and sustainability. CADFEM, powered by Ansys multiphysics solutions, provides end-to-end digital simulation workflows to optimize electrical infrastructure, cooling architectures, and EMI shielding for data centers at rack, room, and facility scale.

Focus Points

Challenges

Rising Power Density in AI Racks

Next-gen AI/ML workloads push racks to 70–100 kW+, demanding advanced cooling strategies.

Thermal Reliability of Liquid & Immersion Cooling

Innovative cooling introduces new reliability risks (leakage, condensation, pump failure).

Electrical Overloads & Power Failures

Peak load conditions stress busbars, UPS systems, and switchgear, risking downtime.

Electromagnetic Interference in High-Speed Systems

Dense PCB and rack integration increases EMI, threatening server compliance and performance.

Sustainability Pressure

Operators face strict energy targets, requiring precise modeling of efficiency metrics.

Applications

Hyperscale & Cloud Providers

AI-ready rack and cooling design, PUE optimization

Enterprise Data Centers

Reliability analysis of electrical distribution and redundancy

Telecom Edge Data Centers

Compact footprint cooling, EMI/EMC compliance

Colocation Facilities

Multi-tenant thermal, electrical, and shielding optimization

Defense & Mission-Critical

Ruggedized, fault-tolerant, and EMI-hardened data center design

CADFEM India
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